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  • 技術產品
    • DESIGN EXCELLENCE
      • 數位設計流程
        • PRODUCT CATEGORIES
          • Logic Equivalence Checking
          • SoC Implementation and Floorplanning
          • Functional ECO
          • Low-Power Validation
          • Synthesis
          • Power Analysis
          • Constraints and CDC Signoff
          • Silicon Signoff and Verification
          • Library Characterization
          • Test
        • FEATURED PRODUCTS
          • Cerebrus Intelligent Chip Explorer
          • Genus Synthesis Solution
          • Innovus Implementation System
          • Tempus Timing Signoff Solution
          • Pegasus Verification System
          • RESOURCES
          • Flows
          • Voltus IC Power Integrity Solution
      • 客製IC/類比/RF設計
        • PRODUCT CATEGORIES
          • Circuit Design
          • Circuit Simulation
          • Layout Design
          • Layout Verification
          • Library Characterization
          • RF / Microwave Solutions
        • FEATURED PRODUCTS
          • Spectre X Simulator
          • Spectre FX Simulator
          • Virtuoso Layout Suite
          • Virtuoso ADE Product Suite
          • Virtuoso Advanced Node
          • Voltus-Fi Custom Power Integrity Solution
          • RESOURCES
          • Flows
      • 系統設計與驗證
        • PRODUCT CATEGORIES
          • Debug Analysis
          • Virtual Prototyping
          • Emulation and Prototyping
          • Static and Formal Verification
          • Planning and Management
          • Simulation
          • Software-Driven Verification
          • Verification IP
          • System-Level Verification IP
        • FEATURED PRODUCTS
          • vManager Verification Management
          • Xcelium Logic Simulation
          • Palladium Enterprise Emulation
          • Protium Enterprise Prototyping
          • System VIP
          • RESOURCES
          • Flows
          • Jasper C Apps
          • Helium Virtual and Hybrid Studio
      • IP
        • PRODUCT CATEGORIES
          • Denali Memory Interface and Storage IP
          • 112G/56G SerDes
          • PCIe and CXL
          • Tensilica Processor IP
          • Chiplet and D2D
          • Interface IP
        • RESOURCES
          • Discover PCIe
      • IC封裝設計與分析
        • PRODUCT CATEGORIES
          • Cross-Platform Co-Design and Analysis
          • IC Package Design
          • SI/PI Analysis
          • SI/PI Analysis Point Tools
          • Flows
    • SYSTEM INNOVATION
      • 系統分析
        • PRODUCT CATEGORIES
          • Computational Fluid Dynamics
          • Electromagnetic Solutions
          • RF / Microwave Design
          • Signal and Power Integrity
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        • FEATURED PRODUCTS
          • Clarity 3D Solver
          • Clarity 3D Solver Cloud
          • Clarity 3D Transient Solver
          • Celsius Thermal Solver
          • Fidelity CFD
          • Sigrity Advanced SI
          • Celsius Advanced PTI
          • RESOURCES
          • System Analysis Center
          • System Analysis Resources Hub
          • AWR Free Trial
      • 嵌入式軟體
      • PCB設計與分析
        • PRODUCT CATEGORIES
          • Design Authoring
          • PCB Layout
          • Library and Design Data Management
          • Analog/Mixed-Signal Simulation
          • SI/PI Analysis
          • SI/PI Analysis Point Tools
          • RF / Microwave Design
          • Augmented Reality Lab Tools
        • FEATURED PRODUCTS
          • Allegro Package Designer Plus
          • Allegro PCB Designer
          • RESOURCES
          • What's New in Allegro
          • Advanced PCB Design & Analysis Resources Hub
          • Flows
      • Computational Fluid Dynamics
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Virtuoso Variation Option

Advanced statistical exploration of your design

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Key Benefits

  • Easily enables the appropriate analysis by letting you simply choose your task (e.g., yield verification) or statistical corner creation and specify your target sigma requirement
  • Provides high-yield estimation capabilities for checking the outer boundaries of your design at the 4-, 5-, or 6-sigma level
  • Delivers advanced statistical sample reordering that greatly improves the performance of the statistical simulation, with additional speed-up for FinFET technology at 16nm and below
  • Provides mismatch contribution analysis and statistical sensitivity analysis to pinpoint most influential devices within a statistical simulation
  • Features easy, one-step creation of worst-case corners as derived by 3-sigma statistical sampling

The Cadence® Virtuoso® Variation Option extends the statistical variation capabilities of Cadence’s Virtuoso ADE Assembler and Virtuoso ADE Verifier to allow for more sophisticated statistical analyses to be performed on any design. Specialized technology is also available for advanced-node designs.

Statistical sample reordering 

Directly addresses the significant challenges associated with 3-sigma design, especially at an advanced process node or low Vdd. Virtuoso Variation Option provides a statistical approach to verify circuit yield or create corners efficiently by reordering the samples to simulate the worst samples first. The method is co-developed with major foundries to provide with additional speedup for FinFET technology at 16nm and below.

High-yield estimation for 4-, 5-, or 6-sigma analysis

Parametric high-yield estimation is often required on devices that have extremely high volume (i.e., memory devices), or when testing the circuit limits is a must when failure of the part is not an option (i.e., automotive safety or medical devices). The Virtuoso Variation Option provides two methods of simulation to meet and match your needs and conditions:

  • Scaled-sigma sampling (SSS): This preferred statistical method generates samples where the standard deviation has been scaled up which is more accurate than WCD for nonlinear behavior and more efficient when there is a large number of statistical parameters and specifications.
  • Worst-case distance (WCD): This statistical method defines the shortest distance from the nominal point to the specification boundary in the process/mismatch parameter space. WCD typically requires under 100 simulations for each spec and so is suitable for designs with a small number of specs/parameters that need to be monitored/changed.

Automated yield improvement flow

Virtuoso Variation Option has an “Improve Yield” command that will return a design to a state where it meets all of the design criteria and has the highest possible yield. If no such point has been reached it will run iterative analyses on the current criteria and determine the conditions for highest possible yield for that design.

Mismatch contribution analysis

Virtuoso Variation Option has a mismatch contribution analysis feature which is a Monte Carlo post-processing feature that helps in identifying the important contributors to mismatch variation. You can then modify the identified devices in the schematic and make the design less sensitive to mismatch variation. 

Automotive TCL1 Certified for ISO 26262

The industry’s first analog/mixed-signal design implementation and verification flow to achieve “Fit for Purpose - Tool Confidence Level 1 (TCL1)” certification enables you to meet stringent ISO 26262 automotive safety requirements. The flow brings transistor-level designs from creation and simulation through physical implementation and verification using the Virtuoso ADE Product Suite and the Spectre® Circuit Simulation Platform. The Virtuoso ADE Verifier provides design engineers with an integrated means to validate the safety specifications against individual circuit specifications for design confidence. For information on the safety manuals, Tool Confidence Analysis (TCA) documents, and compliance reports from TÜV SÜD, download the Functional Safety Documentation Kits through Cadence Online Support.

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Videos

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  • Tower Semiconductor and Cadence Announce New Reference Flow for Advanced 5G Communications and Automotive IC Development 08/16/2021

  • Cadence最新版AWR設計環境平台 加速RF卓越設計 06/22/2021

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