overview
Easy-to-Use EM-IR Flow Enables Full-Chip Verification
The Cadence Voltus-XFi Custom Power Integrity Solution is a transistor-level electromigration and IR drop (EM-IR) tool that delivers foundry-supported SPICE-level accuracy for power integrity signoff.
EM-IR presents unique challenges at the transistor level, from complex EM rules to the high costs of simulating for current on a large RC network at post-layout. Enabled via an integration with the Cadence Spectre X SPICE Simulator and the Virtuoso Design Platform, the Voltus-XFi solution accelerates power signoff analysis and closure.
Key Benefits
Productivity to Reach Your Aggressive Time-to-Market Goals
Accurate, Comprehensive Analysis
Foundry enablement on EM rules and IR drop accuracy for FinFET and FD-SOI nodes
Improved Productivity
Integrated EM-IR flow enables easy and fast complete analysis and debugging
Optimized Performance
Our patented voltage-based method provides a smaller memory footprint and runs faster than the direct method
Integrated Cadence Ecosystem
Integrated with Cadence’s Voltus IC Power Integrity Solution for full-chip support
Features
Features
Central cockpit for EM-IR flow
Workflow based on extraction, simulation, analysis, and debugging in one place
Best-in-class use model with minimum tuning
Simple option balances accuracy and performance tradeoff
Comprehensive debugging options
EM-IR Results Browser summarizes EM-IR information, highlights violations, and makes errors easy to fix
Full chip support
Creates power-grid-view (PGV) macro model for the analyzed transistor block/IP and passes the model to the Voltus IC Power Integrity Solution for full-chip signoff
