理解“设计的相互依赖性对电路性能的影响”
打造智慧生活时代的电子系统时，未来的设计人员需要掌握半导体、芯片封装、系统互连、软硬件集成、系统验证等各个层面技术。传统设计方法孤立地处理以上各层面的问题，已无法满足日益增长的复杂性、低功耗要求和更紧迫的产品上市时间。通过与在电子设计自动化、知识产权、芯片制造以及价值链其他部分的产业生态领导者合作，为“系统设计实现”（System Design Enablement，SDE）营造完善的综合环境，成功的企业得以繁荣发展。Cadence® 定制 IC／模拟／RF解决方案是SDE战略的核心组成部分。
通过选择性地对定制IC的非关键组件进行自动化设计，工程师们可以将精力专注于打造更精准的设计。Cadence电路设计解决方案，包括Virtuoso®模拟设计环境、Spectre® 仿真解决方案和Liberaterate™ 特征库提取与验证解决方案，以及量身打造的电学感知设计（EAD）和先进工艺节点设计流程，使用户可以快速、准确地输入设计概念，并在电路图里自然流畅地管理设计内容。在能感知寄生效应的先进设计环境下，用户能够对一个模拟、RF或混合信号设计的许多相互依赖性进行抽象化和可视化，并理解与决定其对电路性能的影响。
Virtuoso Custom IC, Analog, and RF Design
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Video (85)
- Virtuoso Design Platform for Next-Generation Custom IC and System Design
- Toshiba Electronic Device Solutions Overcomes Complexities of Advanced-Node Designs
- Meeting the Challenges of Chip Design Using the Virtuoso Suite
- Advanced Characterization with Cadence Liberate Trio Characterization Suite
- Lumerical and Cadence Partner to Address the State of Photonics
- Virtuoso RF Solution Electromagnetic Analysis
- Virtuoso RF Solution Edit-in-Concert™ Technology
- Faster Circuit Simulation Trends for Analog Circuit Design
- Balancing Accuracy, Performance, and Capacity for Large Analog Designs
- Solving Analog Simulation Challenges in Complex Designs
- GlobalFoundries Expert Insights: Aging Analysis for IoT and Automotive Applications
- STMicroelectronics 20nm Constraint Driven Modgen Flow
- Looking for Efficiency While Leveraging the MathWorks and Cadence Alliance
- Smart EM Simulation Automates Work for RFIC and RF Module Designs
- New Virtuoso Design Platform for Next-Generation Custom IC and System Design
- NI AXIEM 3D Planar EM Analysis in the Virtuoso Environment
- Overview of the Characterization Interface in Liberate Trio Characterization Suite
- Achieve greater throughput and productivity with Liberate Trio Characterization Suite
- Library Characterization in the Cloud
- Designing High-Reliability Analog and Mixed-Signal ICs for Mission-Critical Applications
- How to Meet the Quality, High Reliability, and Safety Requirements for Analog and Mixed-Signal ICs in Mission-Critical Applications
- Easily Adopt Electro-thermal Simulation for Your High-Reliability Analog Designs
- Improvements in Modeling Device Aging Analysis: Extending Product Lifetime
- Analog Defect Simulation and Analysis for Complex Systems
- Automotive System Trends and the Integration of Analog Electronic Dependability
- Fast & Efficient Memory Verification and Characterization for Advanced On Chip Variation
- Cadence Legato Memory Solution Verification Overview
- Increase Your Productivity with Cadence Legato Memory Solution
- Legato Memory Solution Characterization Overview
- Virtuoso ADE Explorer, Assembler, and Verifier- hear what people are saying about training
- STMicroelectronics – New flow for Analog Top Level Design
- LG Electronics – New Methodology for Full-Chip RFIC Transceiver Co-Verification
- Introducing New Integration with MathWorks
- Extending the Power of MathWorks MATLAB Inside the Virtuoso ADE Suite
- Combined MathWorks and Cadence Design Flow for Analog/Mixed-Signal IC Development
- Invecas Provides Electromigration-Based Maximum Capacitance Limits for Standard Cell Library Using Cadence Virtuoso Liberate Characterization Solution
- Ultra-Low Voltage SRAM: Addressing the Characterization Challenge
- PhoeniX Software: Developing First-Time-Right Photonic ICs
- Omni Design: Increased Speed and Accuracy with Spectre XPS
- STMicroelectronics - Improving Productivity with Virtuoso SPD
- austriamicrosystems - Cadence Unified Custom/Analog Flow Success Video
- ams Reduces IC Development Effort by Collaborating with Cadence on Layout Productivity
- Closing Gaps in Mixed-Signal Power Implementation Using a Consistent Power Intent
- Analog/MS Flow with EAD, Device Checker, and PVS PERC Features
- Global Unichip: 20nm Testchip Tapeout with Cadence and TSMC
- STMicroelectronics - Virtuoso Custom/Analog Expert Insights
- Characterizing 22FDX Library at GLOBALFOUNDRIES
- Cadence Pattern Matching and DFM Signoff
- Silicon Labs Leverages Cadence Mixed-Signal Solution for Mixed Signal Simulation, Implementation and Signoff
- Verifying Data Converters with SPICE Accuracy in Minutes and Hours
- Developing ASICs for High-End ground and space apps at Saphyrion
- Cadence Spectre XPS FastSPICE Simulator for 10X Faster Throughput
- Verification Made Easy: Learn How to Avoid Mistakes with Virtuoso ADE Verifier
- Celebrating 25 Years of Virtuoso Innovation
- Easily Explore and Analyze Your Design with Virtuoso ADE Product Suite
- The New Sound of Analog Design: Simplify Design Verification with Virtuoso ADE Product Suite
- Faster Timing Characterization of Analog Macros
- Fairchild Semiconductor Eases Floorplanning Challenges of Mixed-Signal Design with Virtuoso Platform
- New Capabilities for Accelerating High-Speed Routing
- Virtuoso Electrically Aware Design
- Offering Leading Edge Total Solutions - GLOBALFOUNDRIES Design Ready 14nm Eco System
- Virtuoso IPVS for Advanced Node Design
- Advanced Node Multi-Patterning Technologies within Virtuoso Environment
- Producing Analog/Mixed-Signal IP Requires a Best-in-Class Design Flow
- Custom Layout Methodologies with Virtuoso Advanced Node
- Cadence In-Design DFM-LDE Adoption in ST SmartPower PDK
- Using VSR for Chip Routing on ST smARTpower Technologies
- TowerJazz AMS Reference Flow
- Accurate and Faster SoC Signoff with Simulation-Based AMS Characterization
- Place-and-Route in Under a Day for Allegro Microsystems
- How Electrically Aware Design Reduces Iterations
- Faster Mixed-Signal Simulation Ensures Chip Performance
- Liberate MX Product Demonstration
- Analog Devices Raises Productivity with ModGen Tools
- Get Real-Time Electrical Feedback with Cadence Virtuoso Layout Suite for Electrically Aware Design
- Spectre XPS Demonstration
- Freescale Accelerates Layout Via Constraint-Driven Design Flow
- Verifying PLLs with SPICE Accuracy in Minutes and Hours
- Statistical Characterization Approach Using Liberate MX with 40nm Low Voltage SRAM
- Addressing MCU Mixed-Signal Design Challenges for SoCs and IoT
- Verifying the RTL in an Analog Circuit
- PMC Gains Faster Analog IP Verification with Virtuoso Platform
- STMicroelectronics Automates Full Custom Analog Layout Flow Using Constraints
- CDNLive SV 2014: PMC Improves Visibility and Performance with Spectre APS
- Transistor-Level Reliability Analysis for Advanced Node
Datasheet (38)
- Virtuoso ADE Verifier Chinese Datasheet
- Spectre X Simulator
- Cadence PCell Designer Datasheet
- Spectre Simulation Platform Datasheet
- Spectre Extensive Partitioning Simulator (XPS) Datasheet
- Spectre Accelerated Parallel Simulator (APS) Datasheet
- Spectre X Simulator Datasheet
- Liberate Characterization Portfolio Datasheet
- Liberate Trio Characterization Suite Datasheet
- Legato Reliability Solution Cadence
- Quantus Extraction Solution
- Legato Memory Solution
- Virtuoso ADE Verifier Datasheet
- Virtuoso Layout Suite GXL Datasheet
- Virtuoso ADE Assembler Datasheet
- Virtuoso ADE Explorer Datasheet
- Virtuoso Variation Option Datasheet
- Spectre RF Option Datasheet
- Virtuoso Layout Suite L Datasheet
- Allegro Package Designer Plus SiP Layout Option
- Virtuoso Analog Design Environment Family
- Virtuoso Schematic Editor L and XL Datasheet
- Virtuoso Analog Design Environment GXL Datasheet
- Virtuoso Chip Assembly Router Datasheet
- Cadence Physical Verification System Datasheet
- Virtuoso Variation-Aware Implementation Option Datasheet
- Spectre AMS Designer Datasheet
- Virtuoso Layout Suite for Electrically Aware Design Datasheet
- Virtuoso Mixed-Signal Behavioral Modeling Technology Datasheet
- Virtuoso Visualization and Analysis Datasheet
- Virtuoso Analog Design Environment XL Datasheet
- Virtuoso Digital Implementation Datasheet
- Virtuoso DFM Datasheet
- Virtuoso Analog Design Environment L Datasheet
- Virtuoso Custom Design Platform XL Datasheet
- Cadence SiP RF Design Datasheet
- Cadence Space-based Router Datasheet
Customers Success (10)
- Altair and Cadence Success Story
- Moving to UVM-MS to Meet Coverage Goals Case Study
- Cadence and Texas Instruments Success Story
- Cadence and Melexis Success Story
- Cadence and Rohde & Schwarz Success Story
- Cadence and Fuji Electric Success Story
- Cadence and Teradyne Success Story
- Cadence and Realtek Success Story
- Cadence and Multigig Success Story
- Cadence and Spansion Success Story
Press Releases (43)
- Cadence to Acquire AWR Corporation from National Instruments to Accelerate System Innovation for 5G RF Communications
- Cadence and National Instruments Enter into Strategic Alliance Agreement to Enhance Electronic System Innovation
- Cadence Custom/AMS Flow Certified for Samsung 5LPE Process Technology
- Cadence Automotive Reference Flow Certified by Samsung Foundry for Advanced-Node Design Creation
- Cadence Digital and Signoff Full Flow and Custom/Analog Tools Certified for TSMC N6 and N5/N5P Process Technologies
- Cadence Introduces the Spectre X Simulator, a Massively Parallel Circuit Simulator Delivering Up to 10X Faster Simulation with the Same Golden Accuracy
- Cadence Design Solutions Certified for TSMC-SoIC Advanced 3D Chip Stacking Technology
- Cadence Collaborates with TSMC to Accelerate 5nm FinFET Innovation, Enabling Next-Generation SoC Production Design
- Cadence Selected as Primary EDA Tool Vendor by GLOBALFOUNDRIES
- Cadence Delivers Advanced Packaging Reference Flow for Samsung Foundry Customers
- Cadence Custom/AMS Flow Certified on Samsung 7LPP Process Technology
- Cadence Achieves EDA Certification for TSMC 5nm and 7nm+ FinFET Process Technologies to Facilitate Mobile and HPC Design Creation
- Cadence Launches Liberate Trio Characterization Suite Employing Machine Learning and Cloud Optimizations
- Cadence Design Systems and NI Announce Collaboration to Simplify Next-Generation Semiconductor and RF Development
- Cadence Debuts Industry’s First Analog IC Design-for-Reliability Solution
- Cadence Collaborates with TSMC to Advance 5nm and 7nm+ Mobile and HPC Design Innovation
- Cadence Supports New TSMC WoW Advanced Packaging Technology
- Cadence Expands Virtuoso Platform with Enhanced System Design, Advanced Node Support down to 5nm, and Simulation-Driven Layout
- Cadence Achieves TÜV SÜD’s First Comprehensive “Fit for Purpose - TCL1” Certification in Support of Automotive ISO 26262 Standard
- Cadence Tools and Flows Achieve Production-Ready Certification for TSMC’s 12FFC Process
- Cadence Announces Legato Memory Solution, Industry’s First Integrated Memory Design and Verification Solution
- New Cadence Virtuoso System Design Platform Provides Seamless Design Flow Between IC, Package and Board
- Cadence and MathWorks Announce New Integration to Accelerate Data Mining and Analytics
- Cadence and MathWorks Provide System-Level Simulation Solutions for Mixed-Signal IoT and Automotive Applications
- Cadence and TSMC Advance 7nm FinFET Designs for Mobile and HPC Platforms
- Cadence Unveils Next-Generation Virtuoso Platform Featuring Advanced Analog Verification Technologies and 10X Performance Improvements Across Platform
- Cadence Design Tools Certified for TSMC 7nm Design Starts and 10nm Production
- Silicon Labs Significantly Reduces Design Time Using the Cadence Mixed-Signal Low-Power Flow
- Kandou Uses Cadence Analog/Mixed-Signal Timing and Power Signoff Tools to Deliver High-Speed SerDes PHY IP Design on 28nm Process
- Cadence Collaborates with Lumerical and PhoeniX Software to Offer Virtuoso Platform-Based Design Flow for Electronic /Photonic ICs
- Cadence Unveils Virtuoso Advanced-Node Platform for 10nm Processes
- Cadence Digital, Custom/Analog and Signoff Tools Achieve TSMC Certification for 10nm FinFET Process
- Cadence Implementation and Signoff Tools Certified on Intel Custom Foundry 14nm Process
- Cadence Digital and Custom/Analog Tools Achieve TSMC Certification for 10nm FinFET Early Design Starts
- Cadence and Intel Collaborate to Release 14nm Library Characterization Reference Flow for Customers of Intel Custom Foundry
- Cadence Announces Virtuoso Liberate AMS, Industry's First Dynamic Simulation Characterization Solution for Mixed-Signal Designs
- TSMC Adopts Cadence Solutions for 16nm FinFET Library Characterization
- Cadence Virtuoso Layout Suite for Electrically Aware Design Adopted By ON Semiconductor
- ARM Implements the Cadence Library Characterization Solution for Advanced Node Foundation IP Development
- Cadence Significantly Accelerates Chip Design With New Virtuoso for Electrically Aware Design
- Cadence Characterization Solution for Complex Multi-bit Cells Delivers Power and Performance Benefits for Yamaha
- Cadence Introduces New Mixed-signal and Radio Frequency Capabilities to Address Wireless Design Challenges
- Cadence Announces New OrCAD Technology to Help Shorten PCB Design Cycles
White Paper (15)
- Compressing Datasets Created During Silicon Design White Paper
- Revolution by Evolution: Getting to the Next Technology Breakthrough in Analog Simulation
- Consolidating RF Flow for High-Frequency Product Design
- Analog Reliability Analysis for Mission-Critical Applications White Paper
- Improving Test Coverage and Eliminating Test Ecapes Using Analog Defect Analysis White Paper
- Addressing Process Variation and Reducing Timing Pessimism at 16nm and Below White Paper
- Addressing Memory Characterization Capacity and Throughput Requirements with Dynamic Partitioning White Paper
- Save Time and Minimize Errors by Automating Co-Design and Co-Analysis of Chips, Boards, and Packages
- Massively Parallel Electrically Aware Design White Paper
- Plan-Based Analog Verification Methodology White Paper
- Accelerating Monte Carlo Analysis at Advanced Nodes White Paper
- Addressing the Challenges of Photonic IC Design Via an Integrated Electronic/Photonic Design Automation Environment, Addressing the Challenges of Photonic IC Design Via an Integrated Electronic/Photonic Design Automation Environment White Paper
- A Faster, More Accurate Approach for System-Level Performance Verification of a Wireless RFIC Design White Paper
- Taming the Challenges of 20nm Custom/Analog Design White Paper
- Solutions for Mixed-Signal SoC Verification White Paper
Success Story Video (9)
- Invecas Provides Electromigration-Based Maximum Capacitance Limits for Standard Cell Library Using Cadence Virtuoso Liberate Characterization Solution
- austriamicrosystems - Cadence Unified Custom/Analog Flow Success Video
- Validating Design Intent and Improving Design Quality at Micron
- Characterizing 22FDX Library at GLOBALFOUNDRIES
- Silicon Labs Leverages Cadence Mixed-Signal Solution for Mixed Signal Simulation, Implementation and Signoff
- Faster Timing Characterization of Analog Macros
- Analog Devices Raises Productivity with ModGen Tools
- Freescale Accelerates Layout Via Constraint-Driven Design Flow
- Transistor-Level Reliability Analysis for Advanced Node
Customers
Electrically aware design can enable us to save several iterations on the design of each block sensitive to parasitic effects. Depending on block complexity, design time savings can range from half a day to several days per block.
Martin Kejhar, Senior Technical Staff Engineer and Scientist, ON Semiconductor
定制IC／模拟／RF设计 Products A-Z
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