“The course environment was very good, the instructor was very helpful.”-Blended Course-
Valery Nyama, Inova Semiconductors
"Very good training. Very good tool.”
Andreas Schoch, Texas Instruments
“I successfully learned how to deploy Encounter Test for the various DFT-SCAN preparation checks and SCAN-chain insertion tasks. It was helpful to see (...) how to work with ET scripts in batch mode as well as how to deploy the GUI for resolving typical, basic DFT problems.(...)"
Christian Gehle, Texas Instruments
“Good course with an excellent presenter.”
Josy Bernard, Texas Instruments
“During the labs the trainer gave some additional hints which helped to work with the tool even better.”
Patrick Runkel, Texas Instruments