Length: 1 1/2 Days (12 hours)
Become Cadence Certified
Course Description
In this course, you will learn how to use the Modus DFT Software Solution Automatic Test Pattern Generation (ATPG) product for static pattern generation and debugging the broken scan chains.
Learning Objectives
After completing this course, you will be able to:
- Introduce the Modus DFT Software Solution
- Identify the Modus Key Technologies
- Define the ATPG (Automatic Test Pattern Generation) flow
- Build a test model (building the Modus DFT Software Solution design database)
- Build the fault model
- Verify test structures (design rule checking)
- Create static tests (Automatic Test Pattern Generation)
- Write the vectors (Verilog, STIL, WGL)
- Debug the broken scan chains using the GUI and Tcl command-line techniques
- Debug the test patterns
Software Used in This Course
Modus DFT Software Solution and Xcelium™ Parallel Simulator
Software Release(s)
MODUS231, XCELIUM2309
Modules in this Course
- Introduction to Modus DFT Software Solution
- Modus Key Technologies
- The ATPG Flow
- Debug Scan Chains with GUI and Tcl Interface
- Analyze Initialization Sequence Using Modus GUI
- Debugging the Test Pattern
- Additional Definition and Concepts
Audience
- ASIC Designers
- Chip Designers
- Circuit Designers
- Custom Circuit Designers
- Design Engineers
- Design for Testability Engineers
- Digital IC Designers
- IC Designers
Prerequisites
You must have experience with or knowledge of:
- Test generation tools
- Digital IC testing
Related Courses
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“The course environment was very good, the instructor was very helpful.”-Blended Course-
Valery Nyama, Inova Semiconductors
"Very good training. Very good tool.”
Andreas Schoch, Texas Instruments
“I successfully learned how to deploy Encounter Test for the various DFT-SCAN preparation checks and SCAN-chain insertion tasks. It was helpful to see (...) how to work with ET scripts in batch mode as well as how to deploy the GUI for resolving typical, basic DFT problems.(...)"
Christian Gehle, Texas Instruments
“Good course with an excellent presenter.”
Josy Bernard, Texas Instruments
“During the labs the trainer gave some additional hints which helped to work with the tool even better.”
Patrick Runkel, Texas Instruments