Next-Generation EM-IR Solution for Custom Designs
Michael Tian, vice president of Cadence’s Custom Product Group, introduces us to the Voltus-XFi solution, delivering over 3X productivity gains.
The Cadence Voltus-XFi Custom Power Integrity Solution is a transistor-level electromigration and IR drop (EM-IR) tool that delivers foundry-supported SPICE-level accuracy for power integrity signoff.
EM-IR presents unique challenges at the transistor level, from complex EM rules to the high costs of simulating for current on a large RC network at post-layout. Enabled via an integration with the Cadence Spectre X SPICE Simulator and the Virtuoso Design Platform, the Voltus-XFi solution accelerates power signoff analysis and closure.
Foundry enablement on EM rules and IR drop accuracy for FinFET and FD-SOI nodes
Integrated EM-IR flow enables easy and fast complete analysis and debugging
Our patented voltage-based method provides a smaller memory footprint and runs faster than the direct method
Integrated with Cadence’s Voltus IC Power Integrity Solution for full-chip support
Workflow based on extraction, simulation, analysis, and debugging in one place
Simple option balances accuracy and performance tradeoff
EM-IR Results Browser summarizes EM-IR information, highlights violations, and makes errors easy to fix
Creates power-grid-view (PGV) macro model for the analyzed transistor block/IP and passes the model to the Voltus IC Power Integrity Solution for full-chip signoff