Legato Reliability Solution

One of the most difficult challenges in analog IC design is the increased pressure to make sure mission-critical devices in applications like automotive, medical, industrial, and military/aerospace perform longer and more reliably in any condition or environment. Without a solid solution to solve these design challenges, the cost of failure can be very high and even life-threatening.

The Cadence^® Legato^™ Reliability Solution combines best-in-class Virtuoso^® and Spectre^® technologies to overcome design roadblocks and avoid failures in the field due to analog faults, device aging, electromigration, process variation, and thermal and packaging effects. The solution provides a confident design pathway to:

• Safety through simulation tools to detect failure and analysis of failure recovery for safety mechanisms
• Reliability with advanced degradation models enabling more accurate predictive device aging over time due to internal device and environmental pressures
• Quality to target 0 DPPM using automated defect identification tests to analyze results through the Spectre^® Circuit Simulation Platform

Increased design complexity amplifies challenges. The Legato Reliability solution helps designers avoid these field failures and enables customers to achieve ISO 26262 certification through:

• Analog Defect Analysis: To reduce test cost and eliminates test escapes
• Electrothermal Analysis: To prevent thermal overstress and avoid premature failures
• Advanced Aging Analysis: To accurately predict product wear-out