Statistical Characterization Approach Using Liberate MX with 40nm Low Voltage SRAM

DAC 2013 Mobile Semiconductor Presentation on Statistical Characterization Approach Using Liberate MX with 40nm Low Voltage SRAM. Discussion on Liberate MX designed for macros, Liberate MX Benchmark, Low Voltage SRAM w/Good Yield, Low Voltage,Statistical Timing, Low Voltage Timing Model Challenges

上次修改时间: August 26, 2015

持续时间: 26 min