How You Can Drive Down Digital Logic Test Time

In this short video, Mike Vachon, software engineering group director at Cadence, breaks down the key capabilities of Cadence's new Modus™ Test Solution. Learn how Modus DFT, ATPG, BIST and Diagnostics capabilities work with the test solution's physically aware 2D Elastic Compression architecture to drive down test time for digital logic.

Last Modified: March 24, 2016