Transistor-Level Reliability Analysis for Advanced Node

Sangtae Bae, an analog/mixed-signal circuit designer at IBM, designs high-speed interfaces for IBM's server chips. Bae and his team needed a method to verify circuits will operate in silicon, reliably well over expected life of products. In this 4-minute video, Bae explains how reliability simulation in Cadence® Spectre® Accelerated Parallel Simulator (APS) ran from Cadence Virtuoso® Analog Design Environment (ADE) helped IBM perform reliability analysis efficiently and get to market faster with its server chips.

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Last Modified: June 18, 2016