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Cadence QuickView Layout and Manufacturing Data Viewer 


View and superimpose layout and manufacturing data in multiple formats

QuickView offers high-performance, high-capacity data viewing, from deep sub-micron features to full reticle- or mask-level databases.

Cadence QuickView Layout and Manufacturing Data Viewer Datasheet »

Product ImageCadence® QuickView Layout and Manufacturing Data Viewer is an easy-to-use, high-performance system for viewing and superimposing data in various formats. Its architecture uses separate processes that work together to achieve a modular, highly extensible solution. This makes it easy to add viewing formats and functions, enabling concurrent viewing of multiple formats for comparison and analysis.

Features/Benefits
  • Eliminates costly job-deck errors and improves schedule predictability by using actual mask manufacturing data to perform graphical verification of reticle designs
  • Enables coordinate scaling, off-setting, rotation, and/or mirroring for overlaying and comparing multiple datasets
  • Enables fast and powerful measurement and analysis
  • Supports multiple layout formats: GDSII, OpenAccess, OASIS, LAFF, and GL/1
  • Supports leading manufacturing formats: MEBES through Mode 5 (data, jobdecks, SemiP10), JEOL 2.1, 3.0, and 3.1 (data and jobdecks), Toshiba VSB 11and 12 (data and jobdecks), and HL800, HL900, and HL950 (data)

 

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