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Manufacturability Signoff 

26 resources found
 
Title Type Rated
A Call to Action: How 20nm Will Change IC design White Paper
Format: .PDF (1.3MB)    Date: 08 Feb 2013
 		White Paper
 2
Recommend!
Taming the Challenges of 20nm Custom/Analog Design White Paper
Format: .PDF (1.4MB)    Date: 09 Nov 2012
 		White Paper
 2
Recommend!
Encounter Diagnostics Datasheet
Format: .PDF (1.4MB)    Date: 28 Jun 2012
 		Datasheet
 7
Recommend!
Cadence QRC Extraction Datasheet
Format: .PDF    Date: 16 Feb 2012
 		Datasheet
 8
Recommend!
Cadence Physical Verification System Datasheet
Format: .PDF    Date: 31 Jan 2012
 		Datasheet
 12
Recommend!
Interactive Short Locator: Establishing Efficiency and Predictability in the LVS Short Debug Process for Advanced SoC Designs Technical Paper
Format: .PDF (1.5MB)    Date: 30 Jan 2012
 		Technical Paper
 0
Recommend!
Modeling Stress-Induced Variability Optimizes IC Timing Performance White Paper
Format: .PDF    Date: 08 Dec 2011
 		White Paper
 0
Recommend!
Cadence DFM services Datasheet
Format: .PDF (1.5MB)    Date: 11 Oct 2011
 		Datasheet
 12
Recommend!
Assura Physical Verification Datasheet
Format: .PDF    Date: 01 May 2009
 		Datasheet
 21
Recommend!
Cadence MaskCompose Reticle and Wafer Synthesis Suite Datasheet
Format: .PDF    Date: 05 Aug 2008
 		Datasheet
 11
Recommend!
Cadence QuickView Layout and Manufacturing Data Viewer Datasheet
Format: .PDF    Date: 24 Jul 2008
 		Datasheet
 5
Recommend!
Implementing the Fastest Path from Concept to Consumer for Advanced-Node ICs White Paper
Format: .PDF    Date: 01 Apr 2008
 		White Paper
 7
Recommend!
Cadence Litho Physical Analyzer Datasheet
Format: .PDF    Date: 01 Apr 2008
 		Datasheet
 3
Recommend!
Cadence Litho Electrical Analyzer Datasheet
Format: .PDF    Date: 01 Apr 2008
 		Datasheet
 6
Recommend!
Model-Based Verification and Analysis for 65/45nm Physical Design
Format: .PDF (1.5MB)    Date: 27 Feb 2008
 		Conference Paper
 3
Recommend!
Next-Generation Signoff Analysis Tackles Electrical, Physical, and Manufacturing Challenges White Paper
Format: .PDF    Date: 03 Jan 2008
 		White Paper
 1
Recommend!
Design For Manufacturing And Testability
Format: .PDF    Date: 17 Oct 2007
 		Conference Paper
 5
Recommend!
Model-Based Verification and Analysis for 65/45nm Physical Design
Format: .PDF (1.5MB)    Date: 12 Sep 2007
 		Conference Paper
 1
Recommend!
Chip Design Using 45nm Processes Requires a Holistic Approach to Planning and Implementation White Paper
Format: .PDF    Date: 01 Sep 2007
 		White Paper
 0
Recommend!
Model-based Methods Critical for Effective Manufacturing-aware Physical Design White Paper
Format: .PDF    Date: 01 Sep 2007
 		White Paper
 0
Recommend!
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