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Encounter True-Time ATPG 

Automatic power- and timing-aware test generation

Delivers the industry’s most comprehensive automated test pattern generation (ATPG) solution. Through a broad array of pre-defined and user-defined static and transition-based faults, multiple on-chip compression architectures, and power-aware test capabilities, Encounter True-Time ATPG achieves the most stringent quality and cost goals.

Encounter True-Time ATPG Datasheet »
Choosing the right scan architecture for your design white paper »
Leveraging Physically Aware Design-for-Test white paper »
3 resources found
Title Type Rated
Choosing the Right Scan Compression Architecture for Your Design White Paper
Format: .PDF    Date: 27 Jan 2015
White Paper
Expanding Manufacturing Verification to the Real World with LBIST
Format: .PDF    Date: 20 May 2014
White Paper
Encounter True-Time ATPG Datasheet
Format: .PDF    Date: 28 Jun 2012