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Blogger

Thomas Jackson

Tom Jackson is currently product marketing director for the Cadence DFM group and is responsible for diagnostics and silicon analysis products. Tom has over 20 years of EDA experience and began his career as a test engineer working on hardware accelerators. Tom has also held various positions in field applications and product marketing in the areas of design for test, formal verification, and yield management.

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Diagnosis of Compressed Test Patterns: Several Things to Consider
By Thomas Jackson on October 21, 2008 Today, it is essential to put into place a strong methodology to identify sources of yield loss during manufacturing. One widely accepted method involves diagnosing a representative sample of device failures during manufacturing test. The failing results   Read More »
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What works best?
By Thomas Jackson on August 14, 2008 Today's conventional wisdom tells us EDA folks the majority of yield loss at semiconductor companies is due to systematic issues, that's what my customers say to me. When I speak with new prospective users of my yield ramp solution, I normally   Read More »
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Please allow me to ...
By Thomas Jackson on August 6, 2008 In the words of the Rolling Stones…. Please Allow Me to Introduce Myself ,,,,, I took a different slat than Chris on my intro but I am a Product Marketing Director for Cadence's Diagnostics and silicon analysis products. I also have over 20   Read More »
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Anyone involved in managing OPC or DFM may want to read this
By Thomas Jackson on August 6, 2008 There is a good article in the August edition of Microlithography World that anyone involved in managing OPC or DFM may want to read. I may be a bit biased (I was one of the authors) but it is good...... Here's a link to the article . Fujitsu, Applied   Read More »
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