Measuring Fmax for MOS Transistors
By
Arthur Schaldenbrand
on
August 11, 2011
The following question has come up in comments: "How do I measure F max for an MOS transistor?" The measurement methodology -- testbench, analysis, calculator setup, stimulus, etc.-- does not change whether you are measuring bipolar transistors
Read More »
Comments
(1)
|
 |
Measuring Transistor fmax
By
Arthur Schaldenbrand
on
December 7, 2010
There were several questions about measuring transistor f max in comments posted to my previous Measuring Transistor f t and Simulating MOS Transistor f t blog posts. So in this posting we will look at simulating transistor s-parameters and device characteristics
Read More »
Comments
(2)
|
 |
Measure Twice, Cut Once for Transistor ft
By
Arthur Schaldenbrand
on
October 6, 2010
Recently there was an inquiry about the methodology for performing the f t (transition frequency) versus Ic measurement described in my Measuring Transistor f t blog post from July 2008: By bid75 on September 8, 2010 I am unable to understand how ft vs
Read More »
Comments
(0)
|
 |
Analyzing Distortion With Spectre RF
By
Arthur Schaldenbrand
on
December 18, 2009
Greetings, In the previous appends, we looked at using Shooting Newton Periodic Steady-State analysis to analyze analog circuits. In this append, we will look at using Harmonic Balance Periodic Steady-State, HBPSS, to analyze analog circuits. HBPSS is
Read More »
Comments
(5)
|
 |
Periodic Steady-State Analysis for DC-to-DC Converters
By
Arthur Schaldenbrand
on
June 30, 2009
In " Spectre RF by any other name ...", a non-RF application for Spectre RF's periodic steady-state analysis was introduced. An example of using periodic steady-state analysis [PSS] to simulate the dynamic performance: THD and SFDR, of a
Read More »
Comments
(2)
|
 |
Spectre RF By Any Other Name ...
By
Arthur Schaldenbrand
on
April 22, 2009
It has been a while since I last appende d , hope you are well! It was a little bit difficult to come up with a subject to write about and then recently I was in a meeting where we were talking about transient noise analysis. A designer was discussing
Read More »
Comments
(5)
|
 |
Simulating MOS Transistor ft
By
Arthur Schaldenbrand
on
August 9, 2008
One other question that you might ask is, this approach works for bipolars but what happens when you need to characterize a MOS transistor. Nothing changes, use the same testbench and measurements, see figure 1. In this testbench a MOS transistor is being
Read More »
Comments
(10)
|
 |
Measuring Transistor ft
By
Arthur Schaldenbrand
on
July 16, 2008
So let’s consider a practical example of creating test benches and performing measurements, starting with how to characterize a transistor. A couple of questions to consider before starting are: What parameters do you want to measure? What types
Read More »
Comments
(8)
|
 |
Senrinotabi
By
Arthur Schaldenbrand
on
July 11, 2008
Greetings! My name is Art Schaldenbrand and I have been at Cadence for 12 years supporting the custom IC design tools in the Virtuoso platform. My interests tend to be as widely varied as the customers I work with, ranging from Wireless Design to CMOS
Read More »
Comments
(3)
|
|
View older posts
»
|