One of the questions asked by test designers is: Do I really care about power consumption while the device is in test mode, on the tester?Originally posted in cdnusers.org by wtan
The answer is yes - power consumption of the device on the tester is also a concern. Although the device usually runs at a low frequency on the tester, the toggling rate of the device on the tester is usually much higher that of normal device operation. Therefore, power consumption of the device on the tester can often be even higher than that of normal operation. Because of this, if the power consumption during testing is not managed well, the device may overheat resulting in abnormal behavior, or in extreme cases, even melt down on the tester.
Questions? Comments? Please feel free to post!