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transition fault,pattern fault

  • What Comes Next in IC Fault Modeling?

    The way in which IC designers model potential faults has a direct impact on the quality of silicon and the cost of test. At advanced nodes, fault models must evolve to more accurately represent real silicon effects - without significantly increasing time on the tester. This conflicting set of demands...
    Posted to Industry Insights (Weblog) by rgoering on Wed, Dec 18 2013
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