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power,DFT,don't care,test sequence

  • Don’t Blow Up Your Chip on the Tester!

    The photo at right shows a test socket and chip destroyed by thermal runaway. Can this really happen? Yes, it can and it sometimes does, if test power is significantly greater than functional power. To get a handle on this problem I talked to Bassilios Petrakis, product marketing director for Design...
    Posted to Industry Insights (Weblog) by rgoering on Mon, Mar 26 2012
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