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power management,power test,yield,voltage drop

  • Logic Design and Test Design: Do they need each other?

    Cadence has moved from traditional methods and product offerings for silicon test in favor of a new direction, which answers the title question. In 2008, Cadence recognized that while the Encounter Test product had outstanding quality of results, ease-of-use was lacking. What was perhaps most important...
    Posted to Logic Design (Weblog) by Ed JM on Sat, Apr 17 2010
  • Power Management for Test: A Means of Addressing False Failures

    Engineering teams are tracing test failures back to IR/voltage drop during test mode. These false failures are impacting yield, profitability. We consider this to be a power management issue for test mode and should be approached as early as front-end design and carried through ATPG and pattern/vector...
    Posted to Logic Design (Weblog) by Ed JM on Thu, Oct 23 2008
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