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encounter,placement,lithography,design rules

  • ARM TechCon: Inside Story of a 14nm FinFET Tapeout

    The next frontier in semiconductor design is the 14nm process node, and it will come with a new type of transistor, the FinFET. 14nm FinFET technology moved closer to reality at the ARM TechCon conference Oct. 30, 2012, where a Cadence sponsored technical session announced a 14nm test chip tapeout using...
    Posted to Industry Insights (Weblog) by rgoering on Wed, Oct 31 2012
  • Q&A: A Look at 20nm Design Challenges and Solutions

    The 20nm process node promises tremendous advantages in power, performance and design capacity, but also raises tough design challenges. These challenges include increased timing and power variability, complex layout rules, and incredibly large designs with massive amounts of IP. A major new challenge...
    Posted to Industry Insights (Weblog) by rgoering on Sun, Sep 11 2011
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