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Power,CDNLive!

  • Don’t Blow Up Your Chip on the Tester!

    The photo at right shows a test socket and chip destroyed by thermal runaway. Can this really happen? Yes, it can and it sometimes does, if test power is significantly greater than functional power. To get a handle on this problem I talked to Bassilios Petrakis, product marketing director for Design...
    Posted to Industry Insights (Weblog) by rgoering on Mon, Mar 26 2012
  • CDNLive! Keynote – New Horizons for ARM Based SoCs

    30 billion ARM-based chips have shipped over the last 20 years, but ARM isn't stopping there. ARM is looking beyond cell phones and mobile devices and pursuing new opportunities in the server, home entertainment, and automotive marketplaces, according to Tom Lantzsch (right), executive vice president...
    Posted to Industry Insights (Weblog) by rgoering on Thu, Mar 15 2012
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