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Encounter Test,ATE

  • Place and route on SOC encounter

    Hello, I am a newbie at place and route operation. Can anyone please tell me how do you make sure that all the blockes i your design are arranged in a certain way while doing place and route . I mean I have like around 300 odd blockes to be eranged and I want them to be ordered row wise and column wise...
    Posted to Digital Implementation (Forum) by amythpai on Sun, Mar 17 2013
  • Logic Built-in Self Test (LBIST) is Back – But Not for Manufacturing Test

    Memory providers have long used built-in self test (BIST), a technology that builds self-testing circuitry directly into an IC. Logic BIST (LBIST), which tests the functional logic, has been around for a long time too -- but it did not get much traction except for some high-end CPU server and networking...
    Posted to Industry Insights (Weblog) by rgoering on Thu, May 10 2012
  • Don’t Blow Up Your Chip on the Tester!

    The photo at right shows a test socket and chip destroyed by thermal runaway. Can this really happen? Yes, it can and it sometimes does, if test power is significantly greater than functional power. To get a handle on this problem I talked to Bassilios Petrakis, product marketing director for Design...
    Posted to Industry Insights (Weblog) by rgoering on Mon, Mar 26 2012
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