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ADE-L,sweep

  • Measure Twice, Cut Once for Transistor ft

    Recently there was an inquiry about the methodology for performing the f t (transition frequency) versus Ic measurement described in my Measuring Transistor f t blog post from July 2008: By bid75 on September 8, 2010 I am unable to understand how ft vs. Ic plot is generated. How do you do a nested sweep...
    Posted to RF Design (Weblog) by Art3 on Wed, Oct 6 2010
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