Home > Community > Forums > Custom IC Design > Measure leakage current

Email

* Required Fields

Recipients email * (separate multiple addresses with commas)

Your name *

Your email *

Message *

Contact Us

* Required Fields
First Name *

Last Name *

Email *

Company / Institution *

Comments: *

 Measure leakage current 

Last post Tue, Dec 11 2012 6:47 PM by ntus. 2 replies.
Started by ntus 10 Dec 2012 06:52 PM. Topic has 2 replies and 713 views
Page 1 of 1 (3 items)
Sort Posts:
  • Mon, Dec 10 2012 6:52 PM

    • ntus
    • Not Ranked
    • Joined on Mon, Dec 10 2012
    • Posts 4
    • Points 35
    Measure leakage current Reply

    Hi everyone,

    Im new to this. Can anyone please tell me how to measure leakage current for a NAND gate? 

    • Post Points: 20
  • Tue, Dec 11 2012 8:21 AM

    Re: Measure leakage current Reply

    Hi,

    In general I would set static operating conditions and measure the gate current and the currents in the supply

    of the NAND. If you want to get a more detailed view you need to probe the individual currents of the devices

    within the NAND, e.g. IGD,IGS,IGB for all devices and IDS for the closed devices. This should give you a

    pretty good idea about the leakage mechanisms and the values should be available in the results browser

    after a simple DCOP analysis.

     

    Best Regards

     

    Andi

     

    • Post Points: 20
  • Tue, Dec 11 2012 6:47 PM

    • ntus
    • Not Ranked
    • Joined on Mon, Dec 10 2012
    • Posts 4
    • Points 35
    Re: Measure leakage current Reply

    Thanks for helping Andi!

    • Post Points: 5
Page 1 of 1 (3 items)
Sort Posts:
Started by ntus at 10 Dec 2012 06:52 PM. Topic has 2 replies.