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Power Management for Test: A Means of Addressing False Failures

Comments(0)Filed under: Low power , power estimation, power design, low power test, yield, power test, false fail, voltage drop, power management, IR drop, test mode

Engineering teams are tracing test failures back to IR/voltage drop during test mode.  These false failures are impacting yield, profitability.

We consider this to be a power management issue for test mode and should be approached as early as front-end design and carried through ATPG and pattern/vector analysis and sign-off. 


Can anyone share their thoughts/opinions on top considerations to manage power effectively and productively?

So topics are

  1. Analyzing test patterns for test, the best ways
  2. Rules for planning, and impacts to the design preparing for test power

Looking forward to your input.



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