Home > Community > Blogs > Logic Design > quality of test patterns which metric is most effective for detecting defective chips
 
Login with a Cadence account.
Not a member yet?
Create a permanent login account to make interactions with Cadence more conveniennt.

Register | Membership benefits
Get email delivery of the Logic Design blog (individual posts).
 

Email

* Required Fields

Recipients email * (separate multiple addresses with commas)

Your name *

Your email *

Message *

Contact Us

* Required Fields
First Name *

Last Name *

Email *

Company / Institution *

Comments: *

Quality of test patterns ...which metric is most effective for detecting defective chips?

Comments(1)Filed under: Plan and metrics management, Test, Logic Design, fault model, test escapes, defect testing, defect detection

With lower process geometries and exponential growth in test complexities, associated costs (risks), and aggressive DPPM goals (test escapes):

1) Are today's fault models sufficient to enable defect detection? What are the most common reasons for field escapes

2) Are there any concerns of over-testing due to pessimistic or over-conservative fault models? Do you think too many good chips are wastefully thrown away?

3) Structural and defect-based testing vs. functional tests. What are the scenarios where there are no alternatives to functional tests?

Please share your thoughts.  I've been in the IC design and manufacturing industry for nearly 20yrs and would like to gain more insight into most recent challenges as well as thoughts, beliefs, findings (emperical or otherwise) ...

 

Comments(1)

By TheLowRoad on September 23, 2008
Getting back to fundamentals...!  It is heartening to see that many in the test community are re-examining some of the basics.  Implicit in the questions you are asking is the issue of understanding how we are testing basic logic elements.  While much of the recent press on test has focused on compression and system-level issues, it turns out that much is being left on the table in existing test methodologies becuase of the assumption that "we already have the basics right".  It will be very interesting to watch the light bulbs go off around the world...   ;)

Leave a Comment


Name
E-mail (will not be published)
Comment
 I have read and agree to the Terms of use and Community Guidelines.
Community Guidelines
The Cadence Design Communities support Cadence users and technologists interacting to exchange ideas, news, technical information, and best practices to solve problems and get the most from Cadence technology. The community is open to everyone, and to provide the most value, we require participants to follow our Community Guidelines that facilitate a quality exchange of ideas and information. By accessing, contributing, using or downloading any materials from the site, you agree to be bound by the full Community Guidelines.