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Videos, Presentations Highlight Front-End IC Design Methodologies

Comments(0)Filed under: ARM, Encounter, RTL Compiler, DFT, Logic Design, synthesis, ECOs, Conformal ECO, equivalence checking, Encounter Test, logic synthesis, RTL synthesis, RC, front end design, physical aware synthesis, FED Technology Summit, front end design summit, front-end, FED, test coverage

Want to know how other designers are solving front-end IC design challenges, and what Cadence R&D is doing to help? The Front-End Design (FED) Technology Summit, held at Cadence San Jose headquarters Dec. 6, 2012, provided some helpful answers. Presentations and videos from most of the sessions are now available at the FED Technology Summit archive site (Cadence.com log-in required to view proceedings).

The following presentations and videos are available:

  • Front-End Design Summit - R&D Welcome, Andy Lin, Cadence (video, presentation)
  • Physical Aware Synthesis Challenges on Flash Memory Designs - Dinraj Shetty, Spansion (video, presentation)
  • Physical Aware Synthesis for High Performance Designs: Past, Present and Future - Jean-Charles Giomi, Cadence (video, presentation)
  • RC/LEC Lessons Learned on a High Performance Custom Protocol Processor - Paul Everhardt, Chelsio (video, presentation)
  • A Systematic Test Implementation Methodology - Jon Haldorson, PMC-Sierra (video, presentation)
  • Achieving Your Coverage Goals on Complex Designs Using Encounter Test - Mike Vachon, Cadence (video, presentation)
  • Shared Conformal ECO Experiences - Ajay Bhandari, Cisco (video, presentation)
  • How Can "WI" Help Make Your Verification Easier? - Kei-Yong Khoo, Cadence (presentation)
  • Enabling a More Efficient LP Flow when Using Legacy Libraries - Frank Hsu, VIA Telecom (video, presentation)
  • Leveraging ARM and Cadence Collaboration for Fastest TTM and Best PPA on ARM Cores - Paddy Mamtora, Cadence

To view any of these videos or presentations, click here. More information about Cadence front-end solutions is available here.

Richard Goering

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