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Video Interview: UVM Book Authors Sharon Rosenberg And Kathleen Meade

Comments(1)Filed under: Functional Verification, DAC, OVM, eRM, DVcon, VMM, uvm, Accellera VIP TSC

Earlier today a new book called "A Practical Guide to Adopting the Universal Verification Methodology (UVM)" was released.  As a complement to this detailed post on the book, I've interviewed its authors, Sharon Rosenberg and Kathleen Meade.  In this video, find out from the Sharon and Kathleen how they've worked to build upon the wealth of reference material already available for UVM (like the open source UVM reference flow) to create a comprehensive resource for novice and expert OVM, VMM, and eRM-oriented verification engineers.

 

Click here if the video doesn't start.

Note that this new UVM book is available now in hard copy via several sources listed here; an e-book will follow soon.  You also may be interested in the new TLM-Driven Design and Verification Methodology book, which touches on how UVM users can verify SystemC TLM designs.  Finally, the UVM World forums are alive with news and FAQs from the whole UVM ecosystem.

Some personal background on UVM

As a follow-on to my work in the OVM booth at DAC 2009, at DAC this year I supported the UVM/OVM booth.  Among many interesting observations about the experience, I was frankly stunned by the substantial increase in booth traffic compared to 2009, and the corresponding awareness and interest in the new UVM.

Over the past year I knew anecdotally that OVM was really catching on, reinforced by DVCon experiences and the clear enthusiasm for the UVM announcements there.  However, at DAC 2010 I saw the empirical evidence first-hand: by Day 1 we captured more leads than from all 4 days of DAC 2009.  On the following two days of the show it seemed like I was constantly reaching for the badge scanner.  Granted, some people were just coming by to register for the iPad raffle.  But my anecdotal guesstimate is this was at most 15% of the visitors.  As indicated by their questions, the other 85% were clearly involved in functional verification.  In short, if the energy I experienced at the OVM/UVM DAC booth is any indication, I dare say this book is going to be a best seller.


Joe Hupcey III

On Twitter: @jhupcey, http://twitter.com/jhupcey

 

Comments(1)

By Mary Pat Shawler on July 21, 2010
Just wanted to say I thought the interview was very well done.  I am very interested in your technology and I will definately go out and purchase the book.

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